Wafer Probe Card
-- Semiconductor International, 1/1/2008
TrueScale PP40 is a wafer probe card designed to enable high-efficiency and high-parallelism wafer probing on advanced wire bond logic and SoC devices. It supports pad pitches down to 40 μm, allowing manufacturers to shrink the size of the test pads. The design requires minimal maintenance with no spring positioning adjustment and less frequent cleaning. FormFactor Inc., Livermore, Calif., www.formfactor.com
