AOI Technology
-- Semiconductor International, 8/1/2008
NanoScan is automated optical inspection (AOI) technology for flat panel displays (FPDs), both organic LED and flexible displays. It provides submicron particle inspection (to 300 mm) for the company's AOI platforms, by using advanced illumination techniques. Software allows offline defect analysis. NexTechFAS, Austin, Texas, www.nextechfas.com