Socket Resistance Tester
-- Semiconductor International, 7/1/2008
The CR-2600 socket C-res tester was developed to help IC test engineers who operate without pin-specific C-res data during verification and production, and encounter increased ATE downtimes, shorter socket lifespans and prolonged root-cause analysis of IC failures and signal degradation. An automated benchtop tester allows test engineers to identify the level of electrical resistance on each individual contact in a socket array. The tester uses true four-wire Kelvin techniques and a maintenance-free switching array to obtain accurate high-resolution measurements. Antares Advanced Test Technologies, Vancouver, Wash., www.antares-att.com
